Paper Details

@InProceedings{PerrinsMcEwan12,
  title = "{SEU} {P}rotection for {H}igh-{R}eliability {F}lash {F}ile {S}ystems",
  author= "Perrins, Neil J. and McEwan, Alistair A.",
  editor= "Welch, Peter H. and Barnes, Frederick R. M. and Chalmers, Kevin and Pedersen, Jan Bækgaard and Sampson, Adam T.",
  pages = "219--220",
  booktitle= "{C}ommunicating {P}rocess {A}rchitectures 2012",
  isbn= "978-0-9565409-5-9",
  year= "2012",
  month= "aug",
  abstract= "Single Event Upsets (SEU) are a primary reliability concern
     for electronics in high radiation, highly hostile
     environments such as space. In the case of Field
     Programmable Gate Arrays, the concern is firstly that data
     stored in RAM can be corrupted, and secondly
     that configurable logic blocks can become damaged or
     corrupted. In this talk we will present our considerations
     of this problem in the context of an SRAM-based high
     reliability flash file system. We will firstly demonstrate
     our test harness where we simulate the injection of
     SEUs into our FPGA. We will then discuss how we propose to
     build a self repairing configuration using triple modular
     redundancy and partial dynamic reconfiguration. Finally we
     will discuss how the reliability of the system may be tested
     and measured such that it can be used with confidence in
     either data acquisition or control system applications
     in rad-hard environments."
}

If you have any comments on this database, including inaccuracies, requests to remove or add information, or suggestions for improvement, the WoTUG web team are happy to hear of them. We will do our best to resolve problems to everyone's satisfaction.

Copyright for the papers presented in this database normally resides with the authors; please contact them directly for more information. Addresses are normally presented in the full paper.