Paper Details

%T SEU Protection for High\-Reliability Flash File Systems
%A Neil J. Perrins, Alistair A. McEwan
%E Peter H. Welch, Frederick R. M. Barnes, Kevin Chalmers, Jan Bækgaard Pedersen, Adam T. Sampson
%B Communicating Process Architectures 2012
%X Single Event Upsets (SEU) are a primary reliability concern
   for electronics in high radiation, highly hostile
   environments such as space. In the case of Field
   Programmable Gate Arrays, the concern is firstly that data
   stored in RAM can be corrupted, and secondly
   that configurable logic blocks can become damaged or
   corrupted. In this talk we will present our considerations
   of this problem in the context of an SRAM\-based high
   reliability flash file system. We will firstly demonstrate
   our test harness where we simulate the injection of
   SEUs into our FPGA. We will then discuss how we propose to
   build a self repairing configuration using triple modular
   redundancy and partial dynamic reconfiguration. Finally we
   will discuss how the reliability of the system may be tested
   and measured such that it can be used with confidence in
   either data acquisition or control system applications
   in rad\-hard environments.

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